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[RMY03] Relevant diffracted orders selection in optical characterization of grating by use of neural network

Conférence Internationale avec comité de lecture : First European Scatterometry Workshop, Ile de Porquerolles, France, January 2003,
motcle:
Collaboration: UPMC

BibTeX

@inproceedings {
RMY03,
title="{Relevant diffracted orders selection in optical characterization of grating by use of neural network}",
author=" S. Robert and A. Mure-Ravaud and M. Yacoub and S. Thiria ",
booktitle="{First European Scatterometry Workshop, Ile de Porquerolles, France}",
year=2003,
month="January",
}